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The Advanced Instrumentation Division is focused
on the development of solid-state, magnetic field sensors
and sensor arrays, and applications for those sensors in nondestructive
inspection (NDI), in-circuit testing, anti-tampering for integrated
circuits, and biomedical applications.
| NDI
of Metallic Components |
RMD has developled the following sensors:
Solid-state Sensors and Sensor Arrays
-----Sensors
and sensor arrays made from magnetoresistive materials that
are 106 times more sensitive than coil-based sensors
Nondestructive Evaluation - Metallic Components
-----Solid-state magnetic field
sensors that can be used to detect induced eddy currents in
metallic structures, as well as for a wide range of eddy current
testing (ECT) applications.
Magnetic Imaging
-----Sensor arrays which
permit the formation of magnetic images, allowing the detection
and analysis of defects in metals.
Second Layer Defect Detection
-----Magnetic imaging can detect
flaws and corrosion that are deeply buried in a metal, or
hidden by paint and overlying layers of metal.
Stand-off Detection
-----Based on magnetic imaging,
RMD can image defects without immediate contact with a part.
Portable Defect Detection and Imaging
-----RMD offers a portable
instrument that can be easily carried by an inspector.
Replacement of Coil-Based Eddy Current
Sensors
-----Solid-state
sensors made by RMD can be used as direct replacement of coil-based
sensors used in existing ECT equipment, increasing sensitivity.
Aging and Prognostics
-----Improved defect and
image analysis techniques allowing the study of defect propagation
due to aging, and prognostics for replacement of components
before they fail in the field.
more
information
| Inspection
of Integrated Circuits (ICs) |
Imaging and Location of Manufacturing Faults
in ICs
-----Revolutionary new technologies
for integrated circuit manufacture and process control. Images
of electric currents and magnetic fields in ICs make possible
the location of defects related to the IC fabrication process.
Improved Manufacturing Yield
-----Pin point resolution
of defects helps identify where in the manufacturing process
changes must be made to increase yield.
In Circuit Test-Automated Test Equipment
----- Can determine the voltage,
frequency and current in real time at any and all nodes in
a circuit without contact.
Curve-Tracer
-----Replace the traditional
curve-tracer with a portable instrument that can measure current
voltage and frequency on any IC pin, or passive components
on a PCB in real-time.
Dynamic testing
-----Performs non-contact
nodal analysis of all circuit components on a printed circuit
board.
 Magnetic
Vision System for IC Inspection
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