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Laser-pixillated microcolumnar scintillator materials
Scanning electron microscope micrograph
Focused pixelation eliminates parallax in a solid or microcolumnar scintillator
Focused pixelation eliminates parallax in a solid or microcolumnar scintillator. Parallax effects are otherwise inherent, because of a scintillator's finite thickness.
ENLARGEMENT
CsI Film Side View
Triple-layer neutron-specific scintillator
Radiograph of a hand phantom illustrating the improvement in light collection and resolution provided by RMD's pixelated CsI:Tl
Radiograph of a hand phantom illustrating the improvement in light collection and resolution provided by RMD's pixelated CsI:Tl.
ENLARGEMENT
Imaging Technology Group at RMD

Material Processing Methods

-----In conjunction with our research into the chemical composition, morphology and performance of advanced scintillators and related materials is our development and refinement of a wide variety of fabrication and treatment methods that are essential to and/or enhance the properties of our scintillators and related or other materials.

-----Our growing array of material processing methods currently includes:

Microcolumnar film scintillator fabrication produces films of scintillator materials that channel and conserve light within densely packed, highly uniform microcolumns. The needle-like microcolumns are individual and highly parallel, each typically from 250 nm to 2 microns in diameter, to as much as 10 microns in diameter, and number into the millions per square centimeter. Such films up to 1 cm thick have been grown. Films are typically 10 to 500 microns to 3 mm thick and may be from under 1 cm2 to over 19 x 19 inches (48x48 cm2) in area (or over 19" in diameter).

The optical property of total internal reflection within the microcolumns yields high spatial resolution, enhanced contrast resolution and near-maximum light yield without the loss and "smearing" of light inherent in single-crystal amorphous scintillators. These scintillators are produced via vapor deposition techniques on a variety of opaque, translucent and transparent substrates (glasses, metals, ceramics, graphite, etc.) in high-vacuum evaporator chambers at RMD, some of which were developed by RMD to meet specific material growth requirements.

Crystal scintillator fabrication of CsI:Tl,Eu and CsI:Tl,Sm is performed using the Bridgman technique, producing crystals typically up to 2" in diameter.

Crystalline film scintillator fabrication produces uniform, non-columnar, amorphous, monolithic slabs of crystalline scintillator material, up to 7 mm or more in thickness on large area substrates, for imaging applications such as high-magnification radionuclide imaging and for those applications that do not require high intrinsic resolution. These scintillators are usually produced by vapor deposition, and may be made in very large formats.

Hybrid scintillator fabrication combines multiple scintillator, converter and other materials to provide sensors uniquely suited to unusual application requirements.

Pixelated crystalline films (solid slabs) and microcolumnar films using our laser ablation techniques are truly engineered scintillators that offer the advantages of high spatial resolution imaging to unusual and/or demanding applications. The ability to actually separately focus individual fine, uniform crystalline scintillator pixels onto one or more points or regions in space (in front of or behind the scintillator) with constant or variable pitch overcomes the parallax problem heretofore encountered in applications such as pinhole imaging. This pixel structures, in a manner similar to that of microcolumnar films, thereby overcomes the sensor limitations imposed by the traditional trade-off between scintillator resolution and sensitivity, and allows improved light collection efficiency. Typical pixelations include thin films with 10 micron wide grooves and 30 to 250 micron pixel pitch, and thick films with 30 micron wide grooves and 100 to 500 micron pixel pitch. Our economical, well-controlled, uniform pixelation techniques eliminate the expensive and complex sawing and assembly often used to fabricate scintillators.

Neutron detection applications further benefit from our ability to surround each crystalline or microcolumnar scintillator pixel individually with converter materials such as gadolinium or boron compounds (such as Gd2O3) that otherwise cannot or should not be incorporated into the crystal lattice, and with reflective, absorptive and protective coatings to maximally conserve light or eliminate crosstalk.

Scintillator injection techniques allow us to inject scintillator materials (such as CsI-based, NaI-based and plastic scintillators) into fine capillary arrays and honeycomb structures made of various materials and of virtually any size or form for high resolution, high efficiency gamma-ray imaging and neutron detection. Such capillaries may be parallel, with uniform diameter, or may be focused on a point or region in space in front of or behind the scintillator structure, with uniform or varying diameter. Injected structures of thickness ranging from 1 mm to 1 cm can be fabricated to enhance absorption efficiency. The capillary/honeycomb structure eliminates optical crosstalk between neighboring pixels, thereby resulting in high spatial resolution, regardless of sensor thickness. Capillary diameters may vary from 25 microns to over 2 mm, depending on the resolution requirement and the material to be injected. This process is suitable for alkali halide scintillators and plastic scintillators.

Applied slurry scintillator films typically serve the needs of cost-sensitive applications and/or those requiring large-area scintillators that are lens-coupled to photosensors, where spatial resolution and high material thickness is not a critical factor. Such sensors include GOS/Gadox (terbium-doped gadolinium oxysulfide, Gd²O²S:Tb) or other powdered materials that are applied in suspension as thick liquids to medium- to large-area substrates (often aluminum plates), and then allowed to dry.

Pre- and post-fabrication processing and treatment operations allow us to enhance scintillator performance and robustness and, in certain cases, achieve fundamental performance requirements in scintillators fabricated by deposition and other means.

Substrate treatments before deposition (typically in the cases of microcolumnar and crystalline film deposition) help to conserve scintillation light (by the application of reflective coatings), reduce unwanted light and, thus reduce blur (which is also reduced by the application of absorptive coatings), increase sensitivity to thermal neutrons (by the application of a converter material) or promote the adherence of scintillator material to a substrate or even inhibit/prevent adherence of scintillator material to specific substrate areas.

Re-doping after scintillator fabrication enhances scintillation light yield.

Passive functional coatings (typically reflective) before fabrication (typically to substrates) or after fabrication (typically to the tops of scintillators) improve light conservation, internal reflection and emission/transmission, and help to control light propagation.

Active functional coatings before or after fabrication participate in the scintillation process and promote, enhance or otherwise actively affect or participate in light emission, as in the case of neutron detection, where a converter coating (such as a gadolinium-, boron- or lithium-based material) on the substrate and/or the top and other areas of the scintillator provides the mechanism for converting thermal neutron interactions in the coating layer(s) into prompt gamma rays that then interact detectably in the primary scintillator.

Protective coatings after deposition provide hermetic moisture barriers (for hygroscopic materials) and firm to hard outer coats for the physical protection of scintillators and even other coatings.

Scintillator substrate design and selection depends upon the needs of the intended application, and can include opaque and transparent substrates of graphite, glass, fiberoptics, alumina (or other ceramics), aluminum and other materials, in virtually any size, shape and thickness. Opaque substrates are typically selected when the photosensor will be positioned on the scintillator side of the substrate, while photosensors are typically positioned on the substrate side of a sensor using a transparent or fiberoptic substrate. In fact, RMD can supply freestanding scintillators with no substrate, or with a thin, flexible, conformal film (such as Parylene) as the substrate. While most substrates are passive, RMD's methods are also used to deposit or bond scintillators directly onto CCD and CMOS sensors.

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